Bohrmann, Gerhard and Ehrmann, Werner U. (1991): Analysis of sedimentary facies using bulk mineralogical characteristics of Cretaceous to Quaternary sediments from the Kerguelen Plateau; sites 737, 738, and 744

Leg/Site/Hole:
ODP 119
ODP 119 737
ODP 119 738
ODP 119 744
Identifier:
1991-059021
georefid

10.2973/odp.proc.sr.119.122.1991
doi

Creator:
Bohrmann, Gerhard
Alfred Wegener Inst. Polar and Mar. Res., Bremerhaven, Federal Republic of Germany
author

Ehrmann, Werner U.
Tech. Univ. Denmark, Denmark
author

Identification:
Analysis of sedimentary facies using bulk mineralogical characteristics of Cretaceous to Quaternary sediments from the Kerguelen Plateau; sites 737, 738, and 744
1991
In: Barron, John A., Larsen, Birger, Baldauf, Jack G., Alibert, Chantal, Berkowitz, Stephen, Caulet, Jean-Pierre, Chambers, Stephen R., Cooper, Alan K., Cranston, Ray E., Dorn, Wolfgang U., Ehrmann, Werner U., Fox, Richard D., Fryxell, Greta A., Hambrey, Michael J., Huber, Brian T., Jenkins, Christopher J., Kang, Sung-Ho, Keating, Barbara H., Mehl, Klaus W., Noh, Il, Ollier, Gilles, Pittenger, Alan, Sakai, Hideo, Schroder, Claudia J., Solheim, Anders, Stockwell, Dean A., Thierstein, Hans R., Tocher, Bruce, Turner, Brian R., Wei, Wuchang, Mazzullo, Elsa Kapitan (editor), Stewart, Norman J. (editor), Proceedings of the Ocean Drilling Program, Kerguelen Plateau-Prydz Basin; covering Leg 119 of the cruises of the drilling vessel JOIDES Resolution, Port Louis, Mauritius to Fremantle, Australia, sites 736-746, 14 December 1987-20 February 1988
Texas A & M University, Ocean Drilling Program, College Station, TX, United States
119
211-223
Coverage:Geographic coordinates:
North:-50.1340
West:73.0157East: 82.4715
South:-62.4232

Oceanography; Antarctic Ocean; Antarctica; carbonate sediments; framework silicates; Indian Ocean; Kerguelen Plateau; Leg 119; marine geology; mineral composition; minerals; Ocean Drilling Program; oceanography; ODP Site 737; ODP Site 738; ODP Site 744; opal; sedimentary rocks; sediments; silica minerals; silicates; X-ray analysis; X-ray diffraction data;

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