Jackson, Peter D.; Davies, Peter J.; McKenzie, Judith A.; Palmer-Julson, Amanda; Betzler, Christian G.; Brachert, Thomas C.; Chen, Min-Pen; Crumiere, Jean-Pierre; Dix, George; Droxler, Andre W.; Feary, David A.; Gardner, Stefan; Glenn, Craig R.; Isern, Alexandra; Jarrard, Richard D.; Katz, Miriam E.; Konishi, Kenji; Kroon, Dirk; Ladd, John; McNeil, Donald F.; Martin, Jose Manuel; Montaggioni, Lucien F.; Muller, Daniel W.; Omarzai, Sheraz Khan; Pigram, Christopher J.; Swart, Peter K.; Symonds, Philip A.; Watts, Keith F.; Wei, Wuchang (1991): Electrical resistivity core scanning; a new aid to the evaluation of fine scale structure in sedimentary cores. Springer International, Berlin - Heidelberg, Federal Republic of Germany, Scientific Drilling, 2 (1), 41-54, georefid:1991-051950