Hooft, E. E. E.; Schouten, H.; Detrick, R. S. (1995): Constraining crustal emplacement processes from variation in layer 2A thickness near the EPR. American Geophysical Union, Washington, DC, United States, In: Anonymous, AGU 1995 fall meeting, 76 (46, Suppl.), 595, georefid:1996-062906